Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/10356
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dc.contributor.authorKvitnitskaya, O. E.en_US
dc.contributor.authorHARNAGEA, LUMINITAen_US
dc.contributor.authorFeia, O. D.,en_US
dc.contributor.authorEfremov, D. V.en_US
dc.contributor.authorBüchner, B.en_US
dc.contributor.authorNaidyuk, Yu. G.en_US
dc.date.accessioned2025-08-22T10:17:41Z
dc.date.available2025-08-22T10:17:41Z
dc.date.issued2025-07en_US
dc.identifier.citationLow Temperature Physics, 51(07), 856–860.en_US
dc.identifier.issn777Xen_US
dc.identifier.issn1090-651en_US
dc.identifier.urihttps://doi.org/10.1063/10.0036929en_US
dc.identifier.urihttp://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/10356
dc.description.abstractWe measured the I(V) and dV/dI(V) characteristics of TiTe2-based point contacts (PCs) from room to helium temperatures. Features indicating the emergence of charge density wave (CDW) were detected. They represent symmetrical relatively V = 0 maxima in dV/dI(V) around ±150 mV at liquid helium temperatures, which disappear above 150 K, similar to the case of sister CDW compound TiSe2. Applying higher voltages above 200 mV, we observed resistive switching in TiTe2 PCs from a metallic-like low-resistance state to a non-metallic type high-resistance state with a change of resistance by an order of magnitude. A unique diode-like effect was registered in “soft” TiTe2 PCs with hysteretic I(V) at the negative voltage on TiTe2. Discovering the resistive switching and diode effect adds TiTe2 to the transition-metal dichalcogenides, which could be useful in developing non-volatile ReRAM and other upcoming nanotechnologies.en_US
dc.language.isoenen_US
dc.publisherAIP Publishingen_US
dc.subjectPhysicsen_US
dc.subject2025-AUG-WEEK3en_US
dc.subjectTOC-AUG-2025en_US
dc.subject2025en_US
dc.titleObservation of resistive switching and diode effect in the conductivity of TiTe2 point contactsen_US
dc.typeArticleen_US
dc.contributor.departmentDept. of Physicsen_US
dc.identifier.sourcetitleLow Temperature Physicsen_US
dc.publication.originofpublisherForeignen_US
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