Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/10365
Title: Structural, electronic, and magnetic properties of europium films epitaxially grown on W(110)
Authors: Haertl, Patrick
Leisegang, Markus
SANKESHWAR, VIJAYALAXMI
Bode, Matthias
Dept. of Physics
Keywords: Electronic structure
Magnetic anisotropy
Magnetic order
RKKY interaction
Spin texture
Surface states
Ferromagnets
Magnetic thin films
Rare-earth magnetic materials
Low-energy electron
microscopy
Scanning tunneling spectroscopy
Spin-polarized scanning tunneling microscopy
2025-AUG-WEEK1
TOC-AUG-2025
2025
Issue Date: Jul-2025
Publisher: American Physical Society
Citation: Physical Review B, 112, 024416.
Abstract: This study presents a detailed spin-polarized scanning tunneling microscopy (SP-STM) analysis on the structural, electronic, and magnetic properties on europium (Eu) films epitaxially grown on a W(110) substrate. Utilizing optimized growth parameters, we conduct a thickness-dependent series ranging from the submonolayer regime to films as thick as 650 AL. Atomically resolved STM images of a 130 AL Eu film unveil lateral periodic sequences of bcc(110)-ordered dislocation lines sandwiched between adjacent hcp(0001) segments, effectively relieving stress within the films. These dislocation lines exhibit a periodicity of ptopo = (3.36 +/- 0.11) nm. Tunneling spectroscopy reveals that the surface of Eu films hosts a pronounced double-peak structure at about Ubias approximate to +0.30 V and +0.48 V, corresponding to unoccupied sample states. It is interpreted as an exchange-split dz2-like surface state which remains robust even within the bcc(110) structure of the dislocation lines. Magnetically sensitive data reveal a spin spiral with a surface periodicity of pmag = (2.76 +/- 0.19) nm. The results are discussed in terms of bulk-terminated spin spirals in hcp Eu which propagate along (1123) directions in the surface-near region.
URI: https://doi.org/10.1103/175v-7ltx
http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/10365
ISSN: 2469-9950
2469-9969
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