Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/10504
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dc.contributor.authorKuibarov, A.en_US
dc.contributor.authorHARNAGEA, LUMINITA et al.en_US
dc.date.accessioned2025-10-31T04:50:01Z-
dc.date.available2025-10-31T04:50:01Z-
dc.date.issued2025-10en_US
dc.identifier.citationPhysical Review B, 112, 144518.en_US
dc.identifier.issn2469-9950en_US
dc.identifier.issn2469-9969en_US
dc.identifier.urihttps://doi.org/10.1103/5q36-wgl9en_US
dc.identifier.urihttp://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/10504-
dc.description.abstractAngle-resolved photoemission spectroscopy is the leading tool for studying the symmetry and structure of the order parameter in superconductors. The recent improvement of the technique made it possible to detect the superconducting energy gap at the surface of topological t-PtBi2 via observation of the record-breaking narrow line shapes. The promising new physics uncovered requires further investigation of the spectral and gap functions of t-PtBi2, but the challenging experimental conditions severely limit the application of conventional ARPES setups. In this work, we use synchrotron-based measurements and show that the gap at the surface Fermi arc in t-PtBi2 can be detected even with more relaxed experimental conditions than in our previous laser-based studies. At the same time, using simple model of ARPES spectra, we identify the minimum requirements to detect the gap and consider cases where the gap cannot be resolved.en_US
dc.language.isoenen_US
dc.publisherAmerican Physical Societyen_US
dc.subjectElectronic structureen_US
dc.subjectFermi surfaceen_US
dc.subjectSuperconductivityen_US
dc.subjectSurface statesen_US
dc.subjectTopological materialsen_US
dc.subjectTopological superconductorsen_US
dc.subjectWeyl semimetalen_US
dc.subjectAngle-resolved photoemission spectroscopyen_US
dc.subject2025-OCT-WEEK4en_US
dc.subjectTOC-OCT-2025en_US
dc.subject2025en_US
dc.titleMeasuring superconducting arcs by angle-resolved photoemission spectroscopyen_US
dc.typeArticleen_US
dc.contributor.departmentDept. of Physicsen_US
dc.identifier.sourcetitlePhysical Review Ben_US
dc.publication.originofpublisherForeignen_US
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