Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/10895
Title: Dynamics of number entropy for free fermionic systems in the presence of defects and stochastic processes
Authors: Naik, Atharva
AGARWALLA, BIJAY KUMAR
Kulkarni, Manas
Dept. of Physics
Keywords: Entropy
Open quantum systems
Stochastic processes
Transport phenomena
Weak values & weak measurements
Quantum many-body systems
2026-APR-WEEK2
TOC-APR-2026
2026
Issue Date: Apr-2026
Publisher: American Physical Society
Citation: Physical Review B, 113, L161402.
Abstract: We investigate the dynamics of number entropy in a chain of free fermions subjected to both defects and stochastic processes. For a special class of defects, namely conformal defects, we present analytical and numerical results for the temporal growth of number entropy, the time evolution of the number distribution, and the eigenvalue profile of the associated correlation matrix within a subsystem. We show that the number entropy exhibits logarithmic growth in time, originating from the Gaussian structure of the number distribution. We find that the eigenvalue dynamics reveal a profound connection to the reflection and transmission coefficients of the associated scattering problem for a broad range of defects. When stochastic processes are introduced, specifically Stochastic Unitary Processes (SUP) and Quantum State Diffusion (QSD), the number entropy scales as ln⁡(𝑡) in the SUP case and shows strong hints of ln⁡[ln⁡(𝑡)] scaling in the QSD case. These findings establish compelling evidence that number entropy grows logarithmically slower than the corresponding von Neumann entanglement entropy across a wide class of systems.
URI: https://doi.org/10.1103/bksr-fqn6
http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/10895
ISSN: 2469-9969
2469-9950
Appears in Collections:JOURNAL ARTICLES

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.