Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/11269
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dc.contributor.authorP, VISHNUen_US
dc.contributor.authorBAPAT, BHASen_US
dc.date.accessioned2026-06-12T07:18:28Z-
dc.date.available2026-06-12T07:18:28Z-
dc.date.issued2026-05en_US
dc.identifier.citationReview of Scientific Instruments, 97(05).en_US
dc.identifier.issn1089-7623en_US
dc.identifier.issn0034-6748en_US
dc.identifier.urihttps://doi.org/10.1063/5.0331358en_US
dc.identifier.urihttp://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/11269-
dc.description.abstractA cylindrical mirror analyzer (CMA) has been designed for analyzing the energy of the electrons emitted during the ionization process in a crossed electron beam and target gas jet geometry. The CMA is axially coupled to a single field Wiley–McLaren ion time-of-flight spectrometer for studying dissociation dynamics of molecular ions with a check on the participating electronic states. Coincidence detection of energy-selected Auger electrons and the fragmented molecular ions is performed in the experimental setup to obtain detailed information on dissociation dynamics for different electronic states of a di-cation. Electron beams of energy 0.1–5 keV can be used as projectiles for this study. The contribution to the Auger peak from electrons due to direct ionization limits the selectivity of the electronic state. Even with the limitations, the apparatus has a potential for state-selective studies. The details of the setup have been described here along with some selected examples of state selectivity with Ar and CO2 targets.en_US
dc.language.isoenen_US
dc.publisherAIP Publishingen_US
dc.subjectCylindrical Mirror Analyzeren_US
dc.subject2026-JUN-WEEK1en_US
dc.subjectTOC-JUN-2026en_US
dc.subject2026en_US
dc.titleA coupled electron and ion spectrometer for investigating molecular ion fragmentationen_US
dc.typeArticleen_US
dc.contributor.departmentDept. of Physicsen_US
dc.identifier.sourcetitleReview of Scientific Instrumentsen_US
dc.publication.originofpublisherForeignen_US
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