Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/1824
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dc.contributor.authorResmi, V.en_US
dc.contributor.authorAMBIKA, G.en_US
dc.contributor.authorAmritkar, R.E.en_US
dc.date.accessioned2019-02-14T05:51:30Z
dc.date.available2019-02-14T05:51:30Z
dc.date.issued2011-10en_US
dc.identifier.citationPhysical Review E, 84(4), 46212en_US
dc.identifier.issn1539-3755en_US
dc.identifier.issn1550-2376en_US
dc.identifier.urihttp://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/1824-
dc.identifier.urihttps://doi.org/10.1103/PhysRevE.84.046212en_US
dc.description.abstractWe introduce a general mechanism for amplitude death in coupled synchronizable dynamical systems. It is known that when two systems are coupled directly, they can synchronize under suitable conditions. When an indirect feedback coupling through an environment or an external system is introduced in them, it is found to induce a tendency for antisynchronization. We show that, for sufficient strengths, these two competing effects can lead to amplitude death. We provide a general stability analysis that gives the threshold values for onset of amplitude death. We study in detail the nature of the transition to death in several specific cases and find that the transitions can be of two types—continuous and discontinuous. By choosing a variety of dynamics, for example, periodic, chaotic, hyperchaotic, and time-delay systems, we illustrate that this mechanism is quite general and works for different types of direct coupling, such as diffusive, replacement, and synaptic couplings, and for different damped dynamics of the environment.en_US
dc.language.isoenen_US
dc.publisherAmerican Physical Societyen_US
dc.subjectCoupled systemsen_US
dc.subjectAmplitude deathen_US
dc.subjectAntisynchronizationen_US
dc.subjectHyperchaoticen_US
dc.subject2011en_US
dc.titleGeneral mechanism for amplitude death in coupled systemsen_US
dc.typeArticleen_US
dc.contributor.departmentDept. of Physicsen_US
dc.identifier.sourcetitlePhysical Review Een_US
dc.publication.originofpublisherForeignen_US
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