Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/2028
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dc.contributor.authorChowdhury, Sumanen_US
dc.contributor.authorBaidya, Santuen_US
dc.contributor.authorNafday, Dhanien_US
dc.contributor.authorHalder, Soumyajyotien_US
dc.contributor.authorKABIR, MUKULen_US
dc.contributor.authorSanyal, Biplaben_US
dc.contributor.authorSaha-Dasgupta, Tanusrien_US
dc.contributor.authorJana, Debnarayanen_US
dc.contributor.authorMookerjee, Abhijiten_US
dc.date.accessioned2019-02-25T09:03:47Z
dc.date.available2019-02-25T09:03:47Z
dc.date.issued2014-07en_US
dc.identifier.citationPhysica E: Low-dimensional Systems and Nanostructures, 61, 191-197.en_US
dc.identifier.issn1386-9477en_US
dc.identifier.urihttp://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/2028-
dc.identifier.urihttps://doi.org/10.1016/j.physe.2014.04.002en_US
dc.description.abstractWe propose here a first-principles, parameter free, real space method for the study of disordered extended defects in solids. We shall illustrate the power of the technique with an application to graphene sheets with randomly placed Stone-Wales defects and shall examine the signature of such random defects on the density of states as a function of their concentration. The technique is general enough to be applied to a whole class of systems with lattice translational symmetry broken not only locally but by extended defects and defect clusters. The real space approach will allow us to distinguish signatures of specific defects and defect clusters.en_US
dc.language.isoenen_US
dc.publisherElsevier B.V.en_US
dc.subjectExtended disordered defecten_US
dc.subjectReal space recursion methoden_US
dc.subjectunphysical periodicen_US
dc.subjectHamiltonianen_US
dc.subjectSW defects in grapheneen_US
dc.subject2014en_US
dc.titleA real-space study of random extended defects in solids: Application to disordered Stone-Wales defects in grapheneen_US
dc.typeArticleen_US
dc.contributor.departmentDept. of Physicsen_US
dc.identifier.sourcetitlePhysica E: Low-dimensional Systems and Nanostructuresen_US
dc.publication.originofpublisherForeignen_US
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