Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/3635
Title: Scanning probe microscopy of graphene
Authors: DESHPANDE, APARNA
LeRoy, Brian J.
Dept. of Physics
Keywords: Realm of device engineering
Amorphous carbon
Graphene
Intrinsic structure
Electrical transport measurements
Scanning probe microscopy
2012
Issue Date: Jan-2012
Publisher: Elsevier B.V.
Citation: Physica E: Low-dimensional Systems and Nanostructures, 44(4), 743-759.
Abstract: A material with novel fundamental properties that challenge our current understanding is always exciting for research. If the novel properties extend to the realm of device engineering and promise a revolution in applications, then the scope of its research knows no bounds. The story of graphene, the two dimensional form of carbon, has followed this path. Graphene has been the subject of numerous experimental and theoretical investigations since 2004 when an elegant and a simple technique to make monolayer graphene set the stage for extensive research. Many other techniques to make graphene were developed in parallel to this technique. As graphene is replete with unique structural and electronic properties scanning probe microscopy has proved to be an exciting and a rewarding venture. In this review we discuss the findings of scanning probe microscopy and how it has served as an indispensable tool to understand the properties of graphene and further graphene research
URI: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/3635
https://doi.org/10.1016/j.physe.2011.11.024
ISSN: 1386-9477
1873-1759
Appears in Collections:JOURNAL ARTICLES

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