Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/3695
Title: Extreme events and event size fluctuations in biased random walks on networks
Authors: Kishore, Vimal
SANTHANAM, M. S.
Amritkar, R.E.
Dept. of Physics
Keywords: Extreme events
Biased random walks
Generalized strength
Generalized strength
2012
Issue Date: May-2012
Publisher: American Physical Society
Citation: Physical Review E, 85(5),056120 .
Abstract: Random walk on discrete lattice models is important to understand various types of transport processes. The extreme events, defined as exceedences of the flux of walkers above a prescribed threshold, have been studied recently in the context of complex networks. This was motivated by the occurrence of rare events such as traffic jams, floods, and power blackouts which take place on networks. In this work, we study extreme events in a generalized random walk model in which the walk is preferentially biased by the network topology. The walkers preferentially choose to hop toward the hubs or small degree nodes. In this setting, we show that extremely large fluctuations in event sizes are possible on small degree nodes when the walkers are biased toward the hubs. In particular, we obtain the distribution of event sizes on the network. Further, the probability for the occurrence of extreme events on any node in the network depends on its “generalized strength,” a measure of the ability of a node to attract walkers. The generalized strength is a function of the degree of the node and that of its nearest neighbors. We obtain analytical and simulation results for the probability of occurrence of extreme events on the nodes of a network using a generalized random walk model. The result reveals that the nodes with a larger value of generalized strength, on average, display lower probability for the occurrence of extreme events compared to the nodes with lower values of generalized strength.
URI: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/3695
https://doi.org/10.1103/PhysRevE.85.056120
ISSN: 1539-3755
1550-2376
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