Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/3856
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dc.contributor.authorBABAR, ROHITen_US
dc.contributor.authorKABIR, MUKULen_US
dc.date.accessioned2019-09-09T11:25:51Z
dc.date.available2019-09-09T11:25:51Z
dc.date.issued2018-01en_US
dc.identifier.citationPhysical Review B, 97, 045132.en_US
dc.identifier.issn2469-9950en_US
dc.identifier.issn2469-9969en_US
dc.identifier.urihttp://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/3856-
dc.identifier.urihttps://doi.org/10.1103/PhysRevB.97.045132en_US
dc.description.abstractCorrelated interaction between dilute localized impurity electrons and the itinerant host conduction electrons in metals gives rise to the conventional many-body Kondo effect below sufficiently low temperature. In sharp contrast to these conventional Kondo systems, we report an intrinsic, robust, and high-temperature Kondo state in two-dimensional semiconducting phosphorene. While absorbed at a thermodynamically stable lattice defect, Cr impurity triggers an electronic phase transition in phosphorene to provide conduction electrons, which strongly interact with the localized moment generated at the Cr site. These manifest into the intrinsic Kondo state, where the impurity moment is quenched in multiple stages and at temperatures in the 40-200 K range. Further, along with a much smaller extension of the Kondo cloud, the predicted Kondo state is shown to be robust under uniaxial strain and layer thickness, which greatly simplifies its future experimental realization. We predict the present study will open up new avenues in Kondo physics and trigger further theoretical and experimental studiesen_US
dc.language.isoenen_US
dc.publisherAmerican Physical Societyen_US
dc.subjectEngineering the Kondoen_US
dc.subjectState in two-dimensionalen_US
dc.subjectSemiconducting phosphoreneen_US
dc.subject2018en_US
dc.titleEngineering the Kondo state in two-dimensional semiconducting phosphoreneen_US
dc.typeArticleen_US
dc.contributor.departmentDept. of Physicsen_US
dc.identifier.sourcetitlePhysical Review Ben_US
dc.publication.originofpublisherForeignen_US
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