Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/3943
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dc.contributor.authorLim, Yee-Funen_US
dc.contributor.authorPRIYADARSHI, KUMAR et al.en_US
dc.date.accessioned2019-09-09T11:35:44Z
dc.date.available2019-09-09T11:35:44Z
dc.date.issued2018-01en_US
dc.identifier.citationACS Nano, 12(2), 1339-1349.en_US
dc.identifier.issn1936-0851en_US
dc.identifier.issn1936-086Xen_US
dc.identifier.urihttp://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/3943-
dc.identifier.urihttps://doi.org/10.1021/acsnano.7b07682en_US
dc.description.abstractSingle-layer molybdenum disulfide (MoS2) has attracted significant attention due to its electronic and physical properties, with much effort invested toward obtaining large-area high-quality monolayer MoS2 films. In this work, we demonstrate a reactive-barrier-based approach to achieve growth of highly homogeneous single-layer MoS2 on sapphire by the use of a nickel oxide foam barrier during chemical vapor deposition. Due to the reactivity of the NiO barrier with MoO3, the concentration of precursors reaching the substrate and thus nucleation density is effectively reduced, allowing grain sizes of up to 170 ?m and continuous monolayers on the centimeter length scale being obtained. The quality of the monolayer is further revealed by angle-resolved photoemission spectroscopy measurement by observation of a very well resolved electronic band structure and spin-orbit splitting of the bands at room temperature with only two major domain orientations, indicating the successful growth of a highly crystalline and well-oriented MoS2 monolayer.en_US
dc.language.isoenen_US
dc.publisherAmerican Chemical Societyen_US
dc.subjectChemical vapor depositionen_US
dc.subjectMolybdenum disulfideen_US
dc.subjectAngle-resolved photoemissionen_US
dc.subjectSpectroscopy Raman spectroscopyen_US
dc.subject2018en_US
dc.titleModification of Vapor Phase Concentrations in MoS2 Growth Using a NiO Foam Barrieren_US
dc.typeArticleen_US
dc.contributor.departmentDept. of Chemistryen_US
dc.identifier.sourcetitleACS Nanoen_US
dc.publication.originofpublisherForeignen_US
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