Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/4100
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dc.contributor.authorDate, Mihiren_US
dc.contributor.authorMukherjee, Sudiptaen_US
dc.contributor.authorGhosh, Joydeepen_US
dc.contributor.authorSaha, Dipankaren_US
dc.contributor.authorGanguly, Swaroopen_US
dc.contributor.authorLaha, Apurbaen_US
dc.contributor.authorGHOSH, PRASENJITen_US
dc.date.accessioned2019-09-27T06:03:04Z
dc.date.available2019-09-27T06:03:04Z
dc.date.issued2019-09en_US
dc.identifier.citationJapanese Journal of Applied Physics, 58(9).en_US
dc.identifier.issn0021-4922en_US
dc.identifier.issn1347-4065en_US
dc.identifier.urihttp://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/4100-
dc.identifier.urihttps://doi.org/10.7567/1347-4065/ab39d0en_US
dc.description.abstractWe have addressed the existing ambiguity regarding the effect of tensile strain in the underlying GaN layer on Al x Ga1−x N/GaN heterostructure properties. The bandgaps and band-offsets for Al x Ga1−x N on strained GaN were first computed using density functional theory (DFT), in the generalized gradient approximations (GGA) and hybrid functional Gaussian–Perdew–Burke–Ernzerhof (Gau–PBE) regimes. We propose a simple model to relate the GGA and Gau–PBE bandgaps, which is used to determine the realistic bandgaps of strained AlGaN. The bandgaps and band-offsets from the DFT calculations are then used to analytically calculate the two-dimensional electron gas density in an Al x Ga1−x N/GaN hetero-interface. Our bandstructure calculations show that it is not possible to induce significant change in band-offsets through strain in the GaN layer. The charge-density calculations indicate that such strain can, however, modulate the polarization charge and thereby enhance the 2DEG density at the AlGaN/GaN interface substantially.en_US
dc.language.isoenen_US
dc.publisherIOP Publishingen_US
dc.subjectBand-Gapen_US
dc.subjectALXGA1-XNen_US
dc.subjectTemperatureen_US
dc.subjectDependenceen_US
dc.subjectConstantsen_US
dc.subjectTOC-SEP-2019en_US
dc.subject2019en_US
dc.titleEfficient ab initio plus analytic calculation of the effect of GaN layer tensile strain in AlGaN/GaN heterostructuresen_US
dc.typeArticleen_US
dc.contributor.departmentDept. of Physicsen_US
dc.identifier.sourcetitleJapanese Journal of Applied Physicsen_US
dc.publication.originofpublisherForeignen_US
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