Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/4100
Title: Efficient ab initio plus analytic calculation of the effect of GaN layer tensile strain in AlGaN/GaN heterostructures
Authors: Date, Mihir
Mukherjee, Sudipta
Ghosh, Joydeep
Saha, Dipankar
Ganguly, Swaroop
Laha, Apurba
GHOSH, PRASENJIT
Dept. of Physics
Keywords: Band-Gap
ALXGA1-XN
Temperature
Dependence
Constants
TOC-SEP-2019
2019
Issue Date: Sep-2019
Publisher: IOP Publishing
Citation: Japanese Journal of Applied Physics, 58(9).
Abstract: We have addressed the existing ambiguity regarding the effect of tensile strain in the underlying GaN layer on Al x Ga1−x N/GaN heterostructure properties. The bandgaps and band-offsets for Al x Ga1−x N on strained GaN were first computed using density functional theory (DFT), in the generalized gradient approximations (GGA) and hybrid functional Gaussian–Perdew–Burke–Ernzerhof (Gau–PBE) regimes. We propose a simple model to relate the GGA and Gau–PBE bandgaps, which is used to determine the realistic bandgaps of strained AlGaN. The bandgaps and band-offsets from the DFT calculations are then used to analytically calculate the two-dimensional electron gas density in an Al x Ga1−x N/GaN hetero-interface. Our bandstructure calculations show that it is not possible to induce significant change in band-offsets through strain in the GaN layer. The charge-density calculations indicate that such strain can, however, modulate the polarization charge and thereby enhance the 2DEG density at the AlGaN/GaN interface substantially.
URI: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/4100
https://doi.org/10.7567/1347-4065/ab39d0
ISSN: 0021-4922
1347-4065
Appears in Collections:JOURNAL ARTICLES

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