Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/6416
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dc.contributor.advisorBAPAT, BHASen_US
dc.contributor.authorSEN, ARNABen_US
dc.date.accessioned2021-11-30T04:12:47Z-
dc.date.available2021-11-30T04:12:47Z-
dc.date.issued2021-11en_US
dc.identifier.citation163en_US
dc.identifier.urihttp://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/6416-
dc.description.abstractThe probing time for sampling the internal dynamics of a molecular system should be comparable to the time-scale associated with the internal motion in a molecule, which ranges from femtoseconds (fs) to picoseconds (ps). Recent development in laser technology make it possible to probe a molecular system with intense and ultrashort laser pulses with large bandwidth. In the presence of intense ( 10-100 TW/cm2) and ultrashort ( 25 fs) laser field a molecule may go through ionization and eventually dissociates into various ionic and neutral fragments. Several transient electronic processes plays an key role in the molecular dissociation dynamics in the presence of intense, ultrashort laser field. One of the possible ways to understand the dissociation dynamics of the molecular system through various complex electronic processes is by capturing the velocity spread and the angular distribution of the ionic fragments with respect to the polarization axis of the laser field. The main objective of this work is to understand the influence of the electronic processes in the dissociation dynamics. Two different aspects of the electronic processes have been addressed here by using a Velocity Map Imaging (VMI) technique along with detailed quantum chemistry calculations.en_US
dc.language.isoenen_US
dc.subjectStrong Field Physicsen_US
dc.subjectDissociation Dynamicsen_US
dc.subjectUltrafast Phenomenaen_US
dc.subjectMolecular Physicsen_US
dc.titleDissociation Dynamics of Molecules Subject to Intense Ultrashort Laser Pulsesen_US
dc.typeThesisen_US
dc.publisher.departmentDept. of Physicsen_US
dc.type.degreeInt.Ph.Den_US
dc.contributor.departmentDept. of Physicsen_US
dc.contributor.registration20142019en_US
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