Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/7072
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dc.contributor.authorAKHTAR, YASMEEN-
dc.contributor.authorMAITY, SOUMEN-
dc.contributor.authorCHANDRASEKHARAN, RESHMA C.-
dc.coverage.spatialNadi, Fijien_US
dc.date.accessioned2022-06-15T06:26:57Z-
dc.date.available2022-06-15T06:26:57Z-
dc.date.issued2016-12-
dc.identifier.citation2016 IEEE International Conference on Computer and Information Technology (CIT)en_US
dc.identifier.isbn978-1-5090-4314-9-
dc.identifier.urihttps://ieeexplore.ieee.org/document/7876309/authorsen_US
dc.identifier.urihttp://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/7072-
dc.description.abstractSoftware testing is the process of executing a program or system with the intent of finding errors. Budgets assigned for software testing are generally limited. Performing exhaustive testing which tests all possible input combinations (test cases) is practically impossible. A major challenge in testing is how to achieve maximum test coverage using limited number of test cases. In this article, we propose an algebraic method of creating test suites with high 3-way configuration coverage within a fixed number of test cases.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectMathematicsen_US
dc.subject2016en_US
dc.titleGenerating Test Suites with High 3-Way Coverage for Software Testingen_US
dc.typeConference Papersen_US
dc.contributor.departmentDept. of Physicsen_US
dc.identifier.doihttps://doi.org/10.1109/CIT.2016.89en_US
dc.identifier.sourcetitle2016 IEEE International Conference on Computer and Information Technology (CIT)en_US
dc.publication.originofpublisherForeignen_US
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