Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/8691
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dc.contributor.authorLtaief, L. Benen_US
dc.contributor.authorSishodia, K.en_US
dc.contributor.authorMANDAL, S.en_US
dc.contributor.authorDe, S.en_US
dc.contributor.authorKrishnan, R.en_US
dc.contributor.authorMedina, C.en_US
dc.contributor.authorPal, N.en_US
dc.contributor.authorRichter,R.en_US
dc.contributor.authorFennel, T.en_US
dc.contributor.authorMudrich, M.en_US
dc.date.accessioned2024-04-24T05:42:38Z-
dc.date.available2024-04-24T05:42:38Z-
dc.date.issued2023-07en_US
dc.identifier.citationPhysical Review Letters, 131(02), 023001.en_US
dc.identifier.issn1079-7114en_US
dc.identifier.issn0031-9007en_US
dc.identifier.urihttps://doi.org/10.1103/PhysRevLett.131.023001en_US
dc.identifier.urihttp://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/8691-
dc.description.abstractIonization of matter by energetic radiation generally causes complex secondary reactions that are hard to decipher. Using large helium nanodroplets irradiated by extreme ultraviolet (XUV) photons, we show that the full chain of processes ensuing primary photoionization can be tracked in detail by means of high-resolution electron spectroscopy. We find that elastic and inelastic scattering of photoelectrons efficiently induces interatomic Coulombic decay (ICD) in the droplets. This type of indirect ICD even becomes the dominant process of electron emission in nearly the entire XUV range in large droplets with radius ≳40  nm. Indirect ICD processes induced by electron scattering likely play an important role in other condensed-phase systems exposed to ionizing radiation as well, including biological matter.en_US
dc.language.isoenen_US
dc.publisherAmerican Physical Societyen_US
dc.subjectPhysicsen_US
dc.subject2023en_US
dc.titleEfficient Indirect Interatomic Coulombic Decay Induced by Photoelectron Impact Excitation in Large Pure Helium Nanodropletsen_US
dc.typeArticleen_US
dc.contributor.departmentDept. of Physicsen_US
dc.identifier.sourcetitlePhysical Review Lettersen_US
dc.publication.originofpublisherForeignen_US
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