Please use this identifier to cite or link to this item: http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/8954
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dc.contributor.authorGattu, Mytrayaen_US
dc.contributor.authorSREEJITH, G. J.en_US
dc.contributor.authorJain, J. K.en_US
dc.date.accessioned2024-05-29T07:21:32Z
dc.date.available2024-05-29T07:21:32Z
dc.date.issued2024-05en_US
dc.identifier.citationPhysical Review B, 109(20), L201123.en_US
dc.identifier.issn2469-9969en_US
dc.identifier.issn2469-9950en_US
dc.identifier.urihttps://doi.org/10.1103/PhysRevB.109.L201123en_US
dc.identifier.urihttp://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/8954
dc.description.abstractFrom the vantage point of an incompressible fractional quantum Hall (FQH) state, an electron injected into it is a complex bound state of an odd number of composite fermions (CFs) dressed by a cloud of particle-hole pairs of CFs, where each CF itself is the bound state of an electron and an even number of quantized vortices. Recent scanning tunneling microscopy experiments provide a spectroscopic probe of the internal energy levels of this bound state, yielding unique information on the short-distance correlations in the FQH liquids. We present detailed calculations showing that the internal energy levels of this bound state, as manifested in the energy-resolved local density of states, depend sensitively on the filling factor and on whether an electron is added or removed. In general, multiple, approximately equally spaced peaks are predicted, with their separation providing a measure of a renormalized CF cyclotron energy. We discuss what aspects of experiments are explained by our model and which ones remain to be explained.en_US
dc.language.isoenen_US
dc.publisherAmerican Physical Societyen_US
dc.subjectPhysicsen_US
dc.subject2024-MAY-WEEK1en_US
dc.subjectTOC-MAY-2024en_US
dc.titleScanning tunneling microscopy of fractional quantum Hall states: Spectroscopy of composite-fermion bound statesen_US
dc.typeArticleen_US
dc.contributor.departmentDept. of Physicsen_US
dc.identifier.sourcetitlePhysical Review Ben_US
dc.publication.originofpublisherForeignen_US
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