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DC Field | Value | Language |
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dc.contributor.author | KEDIA, DINESH KUMAR | en_US |
dc.contributor.author | JAKHAR, NAVITA | en_US |
dc.contributor.author | SINGH, SURJEET | en_US |
dc.date.accessioned | 2025-04-01T05:18:42Z | |
dc.date.available | 2025-04-01T05:18:42Z | |
dc.date.issued | 2025-03 | en_US |
dc.identifier.citation | Review of Scientific Instruments, 96(03). | en_US |
dc.identifier.issn | 0034-6748 | en_US |
dc.identifier.issn | 1089-7623 | en_US |
dc.identifier.uri | https://doi.org/10.1063/5.0240792 | en_US |
dc.identifier.uri | http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/9434 | |
dc.description.abstract | We have developed a versatile, fully automated Hall measurement setup for operations between room temperature and 750 K and in magnetic fields up to ±10 kOe. Our compact sample holder design with localized heating and minimal heat losses enables precise temperature stability (better than ±10 mK at 750 K) and low power consumption (20–25 W). The setup is housed within a 26 mm air gap between the pole pieces of an electromagnet. The sample holder, enclosed in a quartz tube for a controlled atmosphere, can accommodate various sample shapes and sizes, which can be contacted using adjustable pressure-point contacts. Despite its compact size, bulk thermoelectric samples measuring up to 10 mm laterally can be analyzed successfully. A phase-sensitive lock-in technique and electromagnetic shielding ensure excellent sensitivity, allowing nanovolt Hall signal measurements in high-carrier-concentration samples. We have successfully applied this setup to diverse materials, including a lightly doped germanium (1014 cm−3), degenerate semiconductors from the half-Heusler family (1021 cm−3), and superionic thermoelectrics (1018 cm−3), demonstrating its versatility and reliability. Our results align well with those from commercial systems where available. | en_US |
dc.language.iso | en | en_US |
dc.publisher | AIP Publishing | en_US |
dc.subject | Hall effect | en_US |
dc.subject | Electrical conductivity | en_US |
dc.subject | Precision measurements | en_US |
dc.subject | Semimetals | en_US |
dc.subject | Semiconductor crystals | en_US |
dc.subject | Thermoelectric effects | en_US |
dc.subject | Thermoelectric materials | en_US |
dc.subject | Metals | en_US |
dc.subject | 2025-MAR-WEEK4 | en_US |
dc.subject | TOC-MAR-2025 | en_US |
dc.subject | 2025 | en_US |
dc.title | Advancing precision in Hall effect through localized heating with a compact design | en_US |
dc.type | Article | en_US |
dc.contributor.department | Dept. of Physics | en_US |
dc.identifier.sourcetitle | Review of Scientific Instruments | en_US |
dc.publication.originofpublisher | Foreign | en_US |
Appears in Collections: | JOURNAL ARTICLES |
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