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dc.contributor.authorWoo, Steffi Y.en_US
dc.contributor.authorARORA, ASHISH et al.en_US
dc.date.accessioned2025-04-22T09:46:11Z-
dc.date.available2025-04-22T09:46:11Z-
dc.date.issued2024-07en_US
dc.identifier.citationMicroscopy and Microanalysis, 30, Issue Supplement_1en_US
dc.identifier.issn1431-9276en_US
dc.identifier.issn1435-8115en_US
dc.identifier.urihttps://doi.org/10.1093/mam/ozae044.734en_US
dc.identifier.urihttp://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/9711-
dc.description.abstractNILen_US
dc.language.isoenen_US
dc.publisherOxford University Pressen_US
dc.subjectPhysicsen_US
dc.subject2024en_US
dc.titleManipulating Transition Metal Dichalcogenide Exciton Linewidths and Lineshapes with Dielectric Engineering as Uncovered by Electron Spectroscopiesen_US
dc.typeArticleen_US
dc.contributor.departmentDept. of Physicsen_US
dc.identifier.sourcetitleMicroscopy and Microanalysisen_US
dc.publication.originofpublisherForeignen_US
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