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Temperature dependent reversal of voltage modulated light emission and negative capacitance in AlGaInP based multi quantum well light emitting devices

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dc.contributor.author Bansal, Kanika en_US
dc.contributor.author DATTA, SHOUVIK en_US
dc.date.accessioned 2019-02-14T05:01:22Z
dc.date.available 2019-02-14T05:01:22Z
dc.date.issued 2013-02 en_US
dc.identifier.citation Applied Physics Letters, 102(5), 53508. en_US
dc.identifier.issn 1077-3118 en_US
dc.identifier.uri http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/1630
dc.identifier.uri https://doi.org/10.1063/1.4790609 en_US
dc.description.abstract We report a reversal in negative capacitance (NC) and voltage modulated light emission from AlGaInP based multi-quantum well (QW) electroluminescent diodes under temperature variation. Unlike monotonically increasing continuous wave light emission with decreasing temperature, modulated electroluminescence and negative capacitance first increase to a maximum and then decrease while cooling down from room temperature. Interdependence of such electronic and optical properties is understood as a competition between defect participation in radiative recombination and field assisted carrier escape from the quantum well region during temperature variation. The temperature of maximum light emission must coincide with the operating temperature of a device for better efficiency. en_US
dc.language.iso en en_US
dc.publisher AIP Publishing en_US
dc.subject Voltage modulation en_US
dc.subject light emission en_US
dc.subject Negative capacitance en_US
dc.subject AlGaInP en_US
dc.subject Quantum well light en_US
dc.subject Dielectric response en_US
dc.subject Radiative recombination en_US
dc.subject Negative capacitance en_US
dc.subject 2013 en_US
dc.title Temperature dependent reversal of voltage modulated light emission and negative capacitance in AlGaInP based multi quantum well light emitting devices en_US
dc.type Article en_US
dc.contributor.department Dept. of Physics en_US
dc.identifier.sourcetitle Applied Physics Letters en_US
dc.publication.originofpublisher Foreign en_US


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