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Scanning probe microscopy of graphene

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dc.contributor.author DESHPANDE, APARNA en_US
dc.contributor.author LeRoy, Brian J. en_US
dc.date.accessioned 2019-07-23T11:08:49Z
dc.date.available 2019-07-23T11:08:49Z
dc.date.issued 2012-01 en_US
dc.identifier.citation Physica E: Low-dimensional Systems and Nanostructures, 44(4), 743-759. en_US
dc.identifier.issn 1386-9477 en_US
dc.identifier.issn 1873-1759 en_US
dc.identifier.uri http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/3635
dc.identifier.uri https://doi.org/10.1016/j.physe.2011.11.024 en_US
dc.description.abstract A material with novel fundamental properties that challenge our current understanding is always exciting for research. If the novel properties extend to the realm of device engineering and promise a revolution in applications, then the scope of its research knows no bounds. The story of graphene, the two dimensional form of carbon, has followed this path. Graphene has been the subject of numerous experimental and theoretical investigations since 2004 when an elegant and a simple technique to make monolayer graphene set the stage for extensive research. Many other techniques to make graphene were developed in parallel to this technique. As graphene is replete with unique structural and electronic properties scanning probe microscopy has proved to be an exciting and a rewarding venture. In this review we discuss the findings of scanning probe microscopy and how it has served as an indispensable tool to understand the properties of graphene and further graphene research en_US
dc.language.iso en en_US
dc.publisher Elsevier B.V. en_US
dc.subject Realm of device engineering en_US
dc.subject Amorphous carbon en_US
dc.subject Graphene en_US
dc.subject Intrinsic structure en_US
dc.subject Electrical transport measurements en_US
dc.subject Scanning probe microscopy en_US
dc.subject 2012 en_US
dc.title Scanning probe microscopy of graphene en_US
dc.type Article en_US
dc.contributor.department Dept. of Physics en_US
dc.identifier.sourcetitle Physica E: Low-dimensional Systems and Nanostructures en_US
dc.publication.originofpublisher Foreign en_US


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