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Low temperature nano-spin filtering using a diluted magnetic semiconductor core-shell quantum dot

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dc.contributor.author CHATTOPADHYAY, SAIKAT en_US
dc.contributor.author Sen, Pratima en_US
dc.contributor.author Andrews, Joshep Thomas en_US
dc.contributor.author Sen, Pranay Kumar en_US
dc.date.accessioned 2020-10-20T07:07:33Z
dc.date.available 2020-10-20T07:07:33Z
dc.date.issued 2014-07 en_US
dc.identifier.citation Physica E-Low-Dimensional Systems & Nanostructures, 61, 198-203. en_US
dc.identifier.issn 1386-9477 en_US
dc.identifier.issn 1873-1759 en_US
dc.identifier.uri http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/5230
dc.identifier.uri https://doi.org/10.1016/j.physe.2014.02.026 en_US
dc.description.abstract The spin polarized electron transport properties and spin polarized tunneling current have been investigated analytically in a diluted magnetic semiconductor core–shell quantum dot in the presence of applied electric and magnetic fields. Assuming the electron wave function to satisfy WKB approximation, the electron energy eigenvalues have been calculated. The spin polarized tunneling current and the spin dependent tunneling coefficient are obtained by taking into account the exchange interaction and Zeeman splitting. Numerical estimates made for a specific diluted magnetic semiconductor, viz., core–shell quantum dot establishes the possibility of a nano-spin filter for a particular biasing voltage and applied magnetic field. en_US
dc.language.iso en en_US
dc.publisher Elsevier B.V. en_US
dc.subject Semiconductor en_US
dc.subject Core-shell quantum clot en_US
dc.subject Magnetic impurity en_US
dc.subject Electronic structure en_US
dc.subject Nano-spin filter en_US
dc.subject Dilute magnetic semiconductor en_US
dc.subject 2014 en_US
dc.title Low temperature nano-spin filtering using a diluted magnetic semiconductor core-shell quantum dot en_US
dc.type Article en_US
dc.contributor.department Dept. of Physics en_US
dc.identifier.sourcetitle Physica E-Low-Dimensional Systems & Nanostructures en_US
dc.publication.originofpublisher Foreign en_US


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