| dc.contributor.advisor | PATIL, SHIVPRASAD | |
| dc.contributor.author | INGOLE, HRISHIKESH | |
| dc.date.accessioned | 2024-05-17T09:57:13Z | |
| dc.date.available | 2024-05-17T09:57:13Z | |
| dc.date.issued | 2024-05 | |
| dc.identifier.citation | 56 | en_US |
| dc.identifier.uri | http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/8828 | |
| dc.description.abstract | Conventional AFMs measure cantilever bending, the home-built AFM, developed by Dr. Patil’s group, measures cantilever displacement. This enhanced sensitivity, facilitated by the interfer ometer, enables precise measurements of extremely small amplitudes. Additionally, employing a stiffer cantilever operating in an off-resonance regime is advantageous for experiments conducted in a liquid environment, surpassing the capabilities of traditional AFMs utilised in protein-pulling experiments. The home-built AFM’s current iteration uses an optical fibre setup to construct a Fabry-Perot in terferometer. A TiO2 semi-mirror is coated to the end of a cleaved optical fibre, and when aligned parallel to the cantilever, it forms a Fabry-Perot cavity. However, aligning the optical fibre is challenging and time-consuming, often resulting in sample dehydration. This project aims to devise a novel setup for our AFM to make this alignment procedure easier by making a new design for the home built AFM. | en_US |
| dc.description.sponsorship | IISER Pune | en_US |
| dc.language.iso | en | en_US |
| dc.subject | atomic force microscope | en_US |
| dc.subject | displacement detection | en_US |
| dc.subject | fabry perot interferometer | en_US |
| dc.title | The Novel Design of a Nano-Positioner for Interferometer-Based Atomic Force Microscope | en_US |
| dc.title.alternative | ANovel Design for Interferometer Based Dynamic Atomic Force Microscope | en_US |
| dc.type | Thesis | en_US |
| dc.description.embargo | No Embargo | en_US |
| dc.type.degree | BS-MS | en_US |
| dc.contributor.department | Dept. of Physics | en_US |
| dc.contributor.registration | 20191193 | en_US |