dc.contributor.author |
KEDIA, DINESH KUMAR |
en_US |
dc.contributor.author |
JAKHAR, NAVITA |
en_US |
dc.contributor.author |
SINGH, SURJEET |
en_US |
dc.date.accessioned |
2025-04-01T05:18:42Z |
|
dc.date.available |
2025-04-01T05:18:42Z |
|
dc.date.issued |
2025-03 |
en_US |
dc.identifier.citation |
Review of Scientific Instruments, 96(03). |
en_US |
dc.identifier.issn |
0034-6748 |
en_US |
dc.identifier.issn |
1089-7623 |
en_US |
dc.identifier.uri |
https://doi.org/10.1063/5.0240792 |
en_US |
dc.identifier.uri |
http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/9434 |
|
dc.description.abstract |
We have developed a versatile, fully automated Hall measurement setup for operations between room temperature and 750 K and in magnetic fields up to ±10 kOe. Our compact sample holder design with localized heating and minimal heat losses enables precise temperature stability (better than ±10 mK at 750 K) and low power consumption (20–25 W). The setup is housed within a 26 mm air gap between the pole pieces of an electromagnet. The sample holder, enclosed in a quartz tube for a controlled atmosphere, can accommodate various sample shapes and sizes, which can be contacted using adjustable pressure-point contacts. Despite its compact size, bulk thermoelectric samples measuring up to 10 mm laterally can be analyzed successfully. A phase-sensitive lock-in technique and electromagnetic shielding ensure excellent sensitivity, allowing nanovolt Hall signal measurements in high-carrier-concentration samples. We have successfully applied this setup to diverse materials, including a lightly doped germanium (1014 cm−3), degenerate semiconductors from the half-Heusler family (1021 cm−3), and superionic thermoelectrics (1018 cm−3), demonstrating its versatility and reliability. Our results align well with those from commercial systems where available. |
en_US |
dc.language.iso |
en |
en_US |
dc.publisher |
AIP Publishing |
en_US |
dc.subject |
Hall effect |
en_US |
dc.subject |
Electrical conductivity |
en_US |
dc.subject |
Precision measurements |
en_US |
dc.subject |
Semimetals |
en_US |
dc.subject |
Semiconductor crystals |
en_US |
dc.subject |
Thermoelectric effects |
en_US |
dc.subject |
Thermoelectric materials |
en_US |
dc.subject |
Metals |
en_US |
dc.subject |
2025-MAR-WEEK4 |
en_US |
dc.subject |
TOC-MAR-2025 |
en_US |
dc.subject |
2025 |
en_US |
dc.title |
Advancing precision in Hall effect through localized heating with a compact design |
en_US |
dc.type |
Article |
en_US |
dc.contributor.department |
Dept. of Physics |
en_US |
dc.identifier.sourcetitle |
Review of Scientific Instruments |
en_US |
dc.publication.originofpublisher |
Foreign |
en_US |