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Advancing precision in Hall effect through localized heating with a compact design

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dc.contributor.author KEDIA, DINESH KUMAR en_US
dc.contributor.author JAKHAR, NAVITA en_US
dc.contributor.author SINGH, SURJEET en_US
dc.date.accessioned 2025-04-01T05:18:42Z
dc.date.available 2025-04-01T05:18:42Z
dc.date.issued 2025-03 en_US
dc.identifier.citation Review of Scientific Instruments, 96(03). en_US
dc.identifier.issn 0034-6748 en_US
dc.identifier.issn 1089-7623 en_US
dc.identifier.uri https://doi.org/10.1063/5.0240792 en_US
dc.identifier.uri http://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/9434
dc.description.abstract We have developed a versatile, fully automated Hall measurement setup for operations between room temperature and 750 K and in magnetic fields up to ±10 kOe. Our compact sample holder design with localized heating and minimal heat losses enables precise temperature stability (better than ±10 mK at 750 K) and low power consumption (20–25 W). The setup is housed within a 26 mm air gap between the pole pieces of an electromagnet. The sample holder, enclosed in a quartz tube for a controlled atmosphere, can accommodate various sample shapes and sizes, which can be contacted using adjustable pressure-point contacts. Despite its compact size, bulk thermoelectric samples measuring up to 10 mm laterally can be analyzed successfully. A phase-sensitive lock-in technique and electromagnetic shielding ensure excellent sensitivity, allowing nanovolt Hall signal measurements in high-carrier-concentration samples. We have successfully applied this setup to diverse materials, including a lightly doped germanium (1014 cm−3), degenerate semiconductors from the half-Heusler family (1021 cm−3), and superionic thermoelectrics (1018 cm−3), demonstrating its versatility and reliability. Our results align well with those from commercial systems where available. en_US
dc.language.iso en en_US
dc.publisher AIP Publishing en_US
dc.subject Hall effect en_US
dc.subject Electrical conductivity en_US
dc.subject Precision measurements en_US
dc.subject Semimetals en_US
dc.subject Semiconductor crystals en_US
dc.subject Thermoelectric effects en_US
dc.subject Thermoelectric materials en_US
dc.subject Metals en_US
dc.subject 2025-MAR-WEEK4 en_US
dc.subject TOC-MAR-2025 en_US
dc.subject 2025 en_US
dc.title Advancing precision in Hall effect through localized heating with a compact design en_US
dc.type Article en_US
dc.contributor.department Dept. of Physics en_US
dc.identifier.sourcetitle Review of Scientific Instruments en_US
dc.publication.originofpublisher Foreign en_US


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