Tight (Double) Exponential Bounds for Identification Problems: Locating-Dominating Set and Test Cover

dc.contributor.authorChakraborty, Dipayanen_US
dc.contributor.authorFoucaud, Florenten_US
dc.contributor.authorMajumdar, Diptapriyoen_US
dc.contributor.authorTALE, PRAFULLKUMARen_US
dc.contributor.departmentDept. of Mathematicsen_US
dc.date.accessioned2026-09-24T07:28:53Z
dc.date.issued2026-00en_US
dc.description.abstractWe investigate fine-grained algorithmic aspects for classical identification problems in graphs, namely, Locating-Dominating Set, and in set systems, namely, Test Cover. In the first problem, an input is a graph 𝐺 on 𝑛 vertices and an integer 𝑘, and the objective is to decide whether there is a subset 𝑆 of 𝑘 vertices such that any two distinct vertices not in 𝑆 are dominated by distinct subsets of 𝑆. In the second problem, an input is a set 𝑈 of items, a collection F of subsets of 𝑈 called tests, and an integer 𝑘, and the objective is to select a set 𝑆 of at most 𝑘 tests such that any two distinct items are contained in a distinct subset of tests of 𝑆. For our first result, we Locating-Dominating Set (respectively, Test Cover) parameterized by the treewidth of the input graph (respectively, the incidence graph) does not admit an algorithm running in time 22𝑜⁡(𝗍𝗐) ⋅poly⁡(𝑛) (respectively, 22𝑜⁡(𝗍𝗐) ⋅poly⁡(|𝑈| +|F|))), unless the exponential-time hypothesis (ETH) fails. Next, we prove that unless the ETH fails, Locating-Dominating Set does not admit an algorithm running in time 2𝑜⁡(𝑘2) ⋅poly⁡(𝑛) or a polynomial-time kernelization algorithm that reduces the solution size and outputs a kernel with 2𝑜⁡(𝑘) vertices, and Test Cover does not admit an algorithm running in time 22𝑜⁡(𝑘) ⋅poly⁡(|𝑈| +|F|) or a kernel with 22𝑜⁡(𝑘) vertices. Again, we show that these lower bounds are tight by designing (kernelization) algorithms with matching running times.en_US
dc.identifier.citationSIAM Journal on Discrete Mathematics, 40(03).en_US
dc.identifier.sourcetitleSIAM Journal on Discrete Mathematicsen_US
dc.identifier.urihttps://doi.org/10.1137/24M1692009en_US
dc.identifier.urihttps://dr.iiserpune.ac.in/handle/123456789/11451
dc.language.isoenen_US
dc.publication.originofpublisherForeignen_US
dc.publisherSociety for Industrial and Applied Mathematicsen_US
dc.subjectIdentification problemsen_US
dc.subjectlocating-dominating seten_US
dc.subjectTest coveren_US
dc.subjectDouble-exponential lower bounden_US
dc.subjectETHen_US
dc.subjectKernelization lower boundsen_US
dc.subject2026-SEP-WEEK2en_US
dc.subjectTOC-SEP-2026en_US
dc.subject2026en_US
dc.titleTight (Double) Exponential Bounds for Identification Problems: Locating-Dominating Set and Test Coveren_US
dc.typeArticleen_US

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